Dynamic scan circuitry for A-phase

ABSTRACT

A first dynamic logic circuit has an output node on which a scan value is provided during scan, a second dynamic logic circuit, and one or more third dynamic logic circuits. The first dynamic logic circuit and the second dynamic logic circuit are in a first dynamic phase during functional operation. The third dynamic logic circuits are in a second dynamic phase during functional operation, and an output of the third dynamic circuits is sampled in response to the scan value during scan. In one embodiment, a first clock controls evaluation of the second dynamic logic circuit, and the second clock controls evaluation of the third dynamic logic circuits. The clocks may be generated responsive to a scan clock and/or a scan mode signal to generate at least one evaluate pulse on the first clock and the second clock prior to sampling the output of the third dynamic circuits.

BACKGROUND OF THE INVENTION

[0001] 1. Field of the Invention

[0002] This invention is related to the field of scan testing ofintegrated circuits, particularly dynamic logic circuits.

[0003] 2. Description of the Related Art

[0004] Over time, larger numbers of transistors have been integratedinto integrated circuits. As more transistors can be integrated, thefunctionality that can be realized in a given integrated circuitincreases. The complexity of the integrated circuit similarly increases,and thus the ability to test the circuitry to ensure that it isfunctioning properly remains an important issue.

[0005] One mechanism used to test integrated circuits is scan testing(or, more briefly, “scan”). To support scan testing, various stateelements (e.g. flops, latches, registers, etc.) are typically coupledtogether in a “scan chain”. The state elements may include separatescan-in inputs and/or scan-out outputs which may be connected togetherto form a scan chain. Alternatively, additional circuitry may mux thescan-in and functional inputs to the input of the state element and theoutput of the state element may be used for both scan values andfunctional values. Scan data is shifted into the scan chain, thusloading the state elements with a desired set of test data. Thecircuitry may be clocked functionally for one or more clock cycles, andthen the result data may be shifted out of the scan chain. The resultdata may be compared to expected data to detect defects or improperoperation.

[0006] In the past, dynamic circuitry has not been as fully tested asmay be desired using scan. Dynamic circuitry is clocked, precharging andconditionally discharging based on a clock signal input. In some cases,for example, only the last stage in a dynamic circuit has beenscannable, limiting the ability to use scan to test the dynamiccircuits.

SUMMARY OF THE INVENTION

[0007] An apparatus includes a first dynamic logic circuit having anoutput node on which a scan value is provided during scan, a seconddynamic logic circuit, and one or more third dynamic logic circuits. Thesecond dynamic logic circuit has an input coupled to the output node ofthe first dynamic logic circuit. The first dynamic logic circuit and thesecond dynamic logic circuit are in a first dynamic phase duringfunctional operation. One of the third dynamic logic circuits has aninput coupled to receive a dynamic logic signal which is responsive tothe second dynamic logic circuit. The third dynamic logic circuits arein a second dynamic phase during functional operation, and an output ofthe third dynamic circuits is sampled in response to the scan valueduring scan.

[0008] In one embodiment, various clock generation circuits are includedto generate clocks for the apparatus. A first clock controls evaluationof the second dynamic logic circuit, and the second clock controlsevaluation of the third dynamic logic circuits. The clock generationcircuits may be responsive to a scan clock and/or a scan mode signal togenerate at least one evaluate pulse on the first clock and the secondclock prior to sampling the output of the third dynamic circuits. Amethod is also contemplated. In one implementation, a clock buffercircuit includes a series connection of transistors coupled between afirst node and ground. The series connection of transistors includes atleast a first transistor and a second transistor. The first transistorhas a first control node coupled to receive a first signal correspondingto a functional clock and the second transistor has a second controlnode controlled by an inverse of the first signal. The functional clockoperates during functional operation. Coupled to the first node, a thirdtransistor has a third control node controlled by an inverse of a firstinput. Coupled in parallel with at least the second transistor, a fourthtransistor has a fourth control node controlled by a logic circuitresponsive to the first input and a second input.

BRIEF DESCRIPTION OF THE DRAWINGS

[0009] The following detailed description makes reference to theaccompanying drawings, which are now briefly described.

[0010]FIG. 1 is a block diagram of one embodiment of an integratedcircuit.

[0011]FIG. 2 is a circuit diagram of one embodiment of a clock tree.

[0012]FIG. 3 is a block diagram of one embodiment of a conditional clockbuffer circuit.

[0013]FIG. 4 is a timing diagram illustrating operation of oneembodiment of the conditional clock buffer circuit shown in FIG. 3

[0014]FIG. 5 is a circuit diagram of one embodiment of the conditionalclock buffer circuit.

[0015]FIG. 6 is a block diagram of one embodiment of an integratedcircuit including scan support.

[0016]FIG. 7 is a timing diagram illustrating operation of oneembodiment of scan control signals.

[0017]FIG. 8 is a circuit diagram of one embodiment of static logic scancircuitry.

[0018]FIG. 9 is a circuit diagram of one embodiment of dynamic logicscan circuitry.

[0019]FIG. 10 is a circuit diagram of one embodiment of a flop with scanfunctionality.

[0020]FIG. 11 is a circuit diagram of one embodiment of dynamic logiccircuitry with scan support

[0021]FIG. 12 is a timing diagram illustrating operation of oneembodiment of clock signals and scan control signals for the embodimentof FIG. 11.

[0022]FIG. 13 is a circuit diagram of one embodiment of a clock buffercircuit for the embodiment of FIGS. 11 and 12.

[0023]FIG. 14 is a circuit diagram of one embodiment of dynamic logiccircuitry with scan support.

[0024]FIG. 15 is a timing diagram illustrating operation of oneembodiment of clock signals and scan control signals for the embodimentof FIG. 14.

[0025]FIG. 16 is a circuit diagram of one embodiment of a clock buffercircuit for the embodiment of FIGS. 14 and 15.

[0026]FIG. 17 is a block diagram of one embodiment of a computeraccessible medium.

[0027] While the invention is susceptible to various modifications andalternative forms, specific embodiments thereof are shown by way ofexample in the drawings and will herein be described in detail. Itshould be understood, however, that the drawings and detaileddescription thereto are not intended to limit the invention to theparticular form disclosed, but on the contrary, the intention is tocover all modifications, equivalents and alternatives falling within thespirit and scope of the present invention as defined by the appendedclaims.

DETAILED DESCRIPTION OF EMBODIMENTS

[0028] Conditional Clocking Turning now to FIG. 1, a block diagram ofone embodiment of an integrated circuit 10 is shown. Other embodimentsare possible and contemplated. In the embodiment of FIG. 1, theintegrated circuit 10 includes a clock generation circuit 12, a clocktree 14, and a plurality of subcircuits 16A-16E. The clock generationcircuit 12 is coupled to receive an external clock (CLK_E) and generatea global clock (Global CLK) therefrom. The clock tree 14 is coupled toreceive the global clock and to provide various local clocks (e.g.Local_CLK0, Local_CLK1, Local_CLK2, Local_CLK3, and Local_CLK4 tosubcircuits 16A-16E, respectively).

[0029] The clock generation circuit 12 is configured to generate theglobal clock Global_CLK from the external clock CLK_E for use by thecircuitry illustrated in FIG. 1. The clock generation circuit 12 mayinclude, for example, a phase locked loop (PLL) for locking the phase ofthe global clock to the external clock. The PLL or other clockgeneration circuitry may multiply or divide the frequency of theexternal clock to arrive at the frequency of the global clock. Anydesired clock generation circuitry may be used.

[0030] The global clock is provided to the clock tree 14. The clock tree14 buffers the global clock for distribution to the various loads in theintegrated circuit 10 (e.g. the various subcircuits 16A-16E). Any buffernetwork may be used, as desired. In one embodiment, the clock tree is anH-tree design, although other clock tree designs such as grids may beused. While illustrated in FIG. 1 as a block providing local clocksignals for convenience in the drawing, it is understood that the buffercircuitry forming the clock tree 14 may generally be distributedthroughout the silicon area occupied by the integrated circuit 10. Thebuffer network design may attempt to approximately match the delay fromthe global clock to the various local clock signals. Generally, as usedherein, a clock tree is any buffer network for buffering an input clockto produce local clocks for various circuitry. As will be illustrated inFIG. 2 below, the clock tree 14 may include conditional clock buffersfor conditionally generating the local clocks (e.g. for power savingsreasons).

[0031] The subcircuits 16A-16E may generally provide the functionalitythat the integrated circuit 10 is designed to perform. For example, ifthe integrated circuit 10 includes a processor, subcircuits may includefetch logic, issue logic, and execution units of various types (e.g.integer, floating point, load/store, etc.). The integrated circuit 10may include various interface circuits (e.g. network interfaces,standard I/O interfaces such as peripheral component interconnect (PCI),HyperTransport™, etc.); and each interface circuit may comprise one ormore subcircuits. The integrated circuit 10 may include caches or cachecontrollers, which may comprise one or more subcircuits, and/or a memorycontroller which may comprise one or more subcircuits. Any functionalitymay be included in various embodiments.

[0032] While the subcircuits 16A-16E each receive a local clock in FIG.1, a given subcircuit may receive multiple local clocks. The localclocks may be conditionally generated the same way (e.g. they may beprovided for electrical loading purposes), or may be separatelyconditionally generated. The number of subcircuits may vary fromembodiment to embodiment as well.

[0033] Turning now to FIG. 2, a circuit diagram illustrating oneembodiment of the clock tree 14 which may be employed in one embodimentof the integrated circuit 10 is shown. Other embodiments are possibleand contemplated. In the embodiment of FIG. 2, the clock tree 14includes several levels of buffers (labeled L0-L4 in FIG. 2, with L0being the lowest level at which the local clocks are generated andprovided to subcircuits 16A-16E). Each level of buffers is coupled tothe next higher level of buffers. In the illustrated embodiment, each ofthe levels L1-L3 comprises inverter circuits, although non-invertingbuffer circuits may be used in other embodiments. Level L0 comprisesconditional clock buffer circuits (e.g. circuits 20A-20N illustrated inFIG. 2) coupled to the output of the L1 level. In the illustratedembodiment, the outputs of the L1 buffers are connected together,although other embodiments may connect individual L1 buffer outputs toclock inputs of various conditional clock buffer circuits 20A-20N.

[0034] At each level of buffering, a given buffer may be coupled to somenumber of buffers at the next lower level. The fan-out from a givenbuffer may depend on the characteristics of the transistors in thesemiconductor technology used, the delay associated with wire resistanceand capacitance, etc. Generally, at some number of fan-out, insertion ofa buffer may result in reduced delay overall rather than allowing ahigher fan out. For example, a fan out of around 3 may be providedbetween buffer levels. Any fan out may be used in other embodiments. Forexample, a fan out of 4 or 5, or 2, may be selected in otherembodiments.

[0035] The conditional clock buffer circuits 20A-20N may generate thelocal clock signals conditionally based on a condition input (Con inFIG. 2). The condition input may be generated by observing variousactivity in the corresponding subcircuit 16A-16E, and by generating thecondition input for the corresponding conditional clock buffer circuits20A-20N based on whether or not the corresponding subcircuit is to be inuse in the next clock cycle. For example, clock gating logic 22A may becoupled to provide the condition input to the conditional clock buffercircuit 20A, and clock gating logic 22N may be coupled to provide thecondition input to the conditional clock buffer circuit 20N. Other localclocks may be unconditional. For example, the conditional clock buffercircuit 20B has its condition input tied to a logical one (indicatingthat the Local_CLK1 is to be generated unconditionally in this example).The conditional clock buffer circuitry is still used in this case tominimize delay differences between the unconditional local clocks andthe conditional local clocks. In other embodiments, the conditionalclock buffer circuit may not be used for unconditional clocks.

[0036] In the illustrated embodiment, the condition signal is a logicalone if clock generation is desired for the corresponding local clock andis a logical zero if clock generation is not desired (e.g. the clock isto be “gated”). This example may be used in some of the figuresdescribed below. In other embodiments, the condition signal may be alogical zero if clock generation is not desired and a logical one ofclock generation is desired. The condition signal may be referred to as“asserted” if it is in a state indicating that clock generation isdesired, and “deasserted” if it is in a state indicating that clockgeneration is not desired. As used herein, a clock is “generated” if theclock oscillates in response to the source clock and is “not generated”if the clock is held at a steady level (high or low).

[0037] While the embodiment shown in FIG. 2 includes the conditionalclock buffer circuits at the lowest level (L0) of the local clock tree,other embodiments may include additional levels of buffering below theconditional clock buffer level. It is noted that, while conditionalclocking is implemented at one level in FIG. 2, other embodiments mayimplement additional conditional clocking at one or more coarser levelsthan that shown in FIG. 2. For example, the global clock may bequalified with one or more condition signals at the L4 level to gate theglobal clock, thus indirectly gating all of the local clocks shown inFIG. 2. Conditional clocking may be implemented in any number of levels.

[0038] It is noted that, in other embodiments, the number of levels inthe clock tree may vary. The number of levels may be more or less thanthat shown in the example of FIG. 2.

[0039] Turning now to FIG. 3, a block diagram is shown of one embodimentof the conditional clock buffer circuit 20A. Other clock buffer circuits20B-20N may be similar. Other embodiments are possible and contemplated.Inputs and outputs of the conditional clock buffer circuit 20A arelabeled in FIG. 3 similar to the labeling shown in FIG. 2 (Clk, Con, andO). The conditional clock buffer circuit 20A includes a prechargecircuit 30, a conditional discharge circuit 32, and a latch circuit 34.The precharge circuit 30 is coupled to receive the input clock Clk andis coupled to a node 36. The conditional discharge circuit is coupled toreceive the input clock Clk and the condition signal Con, and is coupledto the node 36. The latch circuit 34 is coupled between the node 36 andthe output O.

[0040] Generally, the precharge circuit 30 precharges the node 36responsive to one phase of the clock Clk. The conditional dischargecircuit 32 conditionally discharges the node 36 during a first portionof a second phase of the clock Clk, dependent on the state of thecondition signal during the first portion (referred to below as thecondition window). If the condition signal is asserted in the conditionwindow, the conditional discharge circuit 32 discharges the node 36 andthe output clock O is generated for that clock cycle of the clock Clk.If the condition signal is deasserted in the condition window, theconditional discharge circuit 32 does not discharge the node 36 and theoutput clock O is not generated for that clock cycle of the clock Clk(i.e. the clock is gated for that clock cycle).

[0041] The condition window may be of any desired width, and may occupyany portion of the second phase of the clock Clk. In one embodiment, thefirst phase is the low phase of the clock Clk and the second phase isthe high phase of the clock Clk. The condition window may begin at therising edge of the clock Clk (the beginning of the high phase) and maycontinue for a predetermined length of time. For example, in oneimplementation, the condition window may be about ¼ of the phase of theclock Clk. In another implementation, the condition window may be abouttwo gate delays in the integrated circuit. As used herein, a “gatedelay” is the delay from a change in an input of a predetermined logicgate to a corresponding change in the output of that logic gate. Forexample, the predetermined logic gate may be an inverter having a fanout of four inverters of the same size. The delay may be measured fromany desired points in the transition of the input and output of thepredetermined logic gate. For example, the delay may be measured fromthe 50% point in the transition of the input to the 50% point in thecorresponding transition of the output. The gate delay may generallydepend on the semiconductor fabrication technology used to fabricate theintegrated circuit 10.

[0042] Since the conditional discharge circuit 32 operates during thecondition window to either discharge or not discharge the node 36, thesetup and hold times for the condition signal may be relative to thecondition window. The total time that the condition signal remains valid(setup time and hold time) may be relatively short (e.g. approximatelythe length of the condition window, or less in some cases). Thus, thedesign of the clock gating logic 22A-22N may be simplified. In somecases, the clock gating logic 22A-22N may be more sophisticated, usingthe additional available time to calculate more complex clock gatingalgorithms. Additionally, since the condition signal may affect theoutput clock O during the condition window only, noise effects on thecondition signal may be lessened in some implementations.

[0043] In some cases, the setup time with respect to the rising edge ofthe clock Clk may be negative (that is, the condition signal may be at avalid level subsequent to the rising edge of the clock Clk and stillcause proper operation). Generally, the conditional signal may beasserted long enough, during the condition window, to discharge the node36 (or may remain deasserted long enough during the condition window toensure that the output clock O is not generated during the clock cycle).Once the condition window has passed, the condition signal may changestate without affecting the output clock O.

[0044] In the illustrated embodiment, the latch circuit 34 latches thevalue driven on the node 36 and provides the output clock O. The latchcircuit 34 may ensure that the output clock O is actively driven (i.e.not floating) at all times. Particularly, during the remaining portionof the second phase, outside of the condition window, the latch circuit34 may actively drive the value resulting from the conditional dischargeof the node 36. As used herein, a latch circuit is any circuit whichcaptures an input value and holds a corresponding output value until theinput value is actively driven again. The latch circuit may beinverting, in which the output value has the opposite binary sense ofthe input value, or non-inverting.

[0045] In another embodiment, the conditional clock buffer circuit 20Amay conditionally precharge the node 36 during the condition window ofone clock phase and discharge the node 36 responsive to the other clockphase. Generally, the conditional clock buffer circuit 20A may generateone state of the output clock (high or low) responsive to a phase of theinput clock and may conditionally generate the other state based on thecondition signal during the condition window.

[0046]FIG. 4 is a timing diagram illustrating operation of oneembodiment of the conditional clock buffer circuit 20A. The inputs andoutput of the clock buffer circuit 20A (Clk, Con, and O) are shown inFIG. 4, as well as the condition window for each clock cycle of theclock Clk. A node N1 is also illustrated in FIG. 4, which is discussedbelow with regard to FIG. 5.

[0047] Two clock cycles of the clock Clk are illustrated in FIG. 4 (anda portion of a third clock cycle is also illustrated). In each clockcycle, a condition window is shown, delimited by vertical dashed linesand illustrated by arrows 40, 42, and 44, respectively. In the first andthird clock cycles, the conditional signal Con is asserted (high in thisexample) during the condition windows 40 and 44, and thus the outputclock O is generated in the first and third clock cycles. The outputclock O is shown in FIG. 4 slightly delayed from the clock Clk toaccount for the operation of the conditional clock buffer 20A.

[0048] On the other hand, the condition signal is deasserted during thecondition window 42, corresponding to the second clock cycle.Accordingly, the output clock O is not generated during the second clockcycle. The output clock O remains constant during the second clock cycle(low in this example).

[0049] Turning next to FIG. 5, a circuit diagram of one embodiment ofthe conditional clock buffer circuit 20A is shown. Other conditionalclock buffer circuits 20B-20N may be similar. Other embodiments arepossible and contemplated. In the embodiment of FIG. 5, the conditionalclock buffer circuit 20A includes transistors T1, T2, T3, and T4. Thetransistor T1 has a source node coupled to the power supply (Vdd), adrain node connected to the drain node of the transistor T2, and a gatenode coupled to receive the clock Clk. The transistors T2, T3, and T4may be a series connection of transistors. The transistor T2 has asource node connected to the drain node of the transistor T3 and a gatenode coupled to receive the clock Clk. The transistor T3 has a sourcenode connected to the drain node of the transistor T4 and a gate nodecoupled to receive the condition signal Con. The transistor T4 has asource node coupled to ground and a gate node connected to the node N1,which is connected to the output of an inverter 46. The transistor T1forms the precharge circuit 30 in this embodiment. The transistors T1-T4(and optionally T5, as described below) and the inverter 46 form theconditional discharge circuit 32 in this embodiment. In the illustratedembodiment, the latch circuit 34 comprises a pair of cross-coupledinverters (and may include an optional additional inverter, as describedbelow).

[0050] During the low phase of the clock Clk, the transistor T1activates and precharges the node 36 to a high voltage. The latchcircuit captures the state of node 36, and drives a corresponding lowvoltage on the output clock O. In response to the rising edge of theclock Clk, the transistor T1 deactivates and the transistor T2activates. Prior to the inverter 46 responding to the rising edge of theclock Clk, the node N1 is high (from the previous low phase of the clockClk), and thus the transistor T4 is active also. If the condition signalis asserted, the transistor T3 is active and the series connection oftransistors T2-T4 discharges the node 36. If the condition signal is notasserted, T3 is inactive and the node 36 remains charged. Once theinverter 46 responds to the rising edge of the clock Clk, the transistorT4 deactivates, closing the condition window. The latch circuit 34captures and retains the state of the node 36 for the remainder of thehigh phase of the clock Clk.

[0051] As mentioned above, in response to the rising edge of the clockClk, the inverter 46 transitions the node N1 low and deactivates thetransistor T4. More particularly, as the inverter 46 begins driving thenode N1 low, the voltage difference between the gate node and the sourcenode of the transistor T4 drops below the threshold voltage for thetransistor T4, and T4 deactivates. For the remainder of the high phaseof the clock Clk (after the node N1 transitions low), changes in thecondition signal do not affect the state of the node 36. The node 36either remains charged or has been discharged, dependent on the state ofthe condition signal during the condition window. In this embodiment,the condition window is defined by the rising edge of the clock Clk andthe transition of the signal on the node N1 low. Referring back to FIG.4, the node N1 is illustrated. The condition windows 40, 42, and 44 endwhen the node N1 is low (or nearly low), as illustrated by the seconddashed vertical line defining each condition window.

[0052] The delay provided by the inverter 46 controls the width of thecondition window for the embodiment of FIG. 5. The transistors formingthe inverter 46 may be sized to generate the desired width. For example,in one implementation, the inverter 46 may be sized to generate two gatedelays of delay from the rising edge of the clock Clk to thedeactivation of the transistor T4. In another implementation, theinverter may be sized to produce a delay of about ¼ clock phase. In yetanother implementation, the inverter may be sized about a factor of 10or less smaller than other inverters used in the integrated circuit 10.

[0053] During the low phase of the clock Clk, the transistor T2 isinactive and the transistor T4 is active. If the condition signal isasserted during this time, the transistor T3 activates. The seriesconnection of the transistors T3 and T4 may discharge the node betweenthe transistors T3 and T2. If the condition signal is not assertedduring the following condition window, when the transistor T2 is active,the node 36 may experience charge sharing with the node between thetransistors T3 and T2. The charge sharing may cause a temporary glitchon the node 36 before the feedback inverter in the latch circuit 34(which may be relatively weak to allow the transistor T1 and the seriesconnection of transistors T2-T4 to overdrive it) restores the voltage onthe node 36. The transistor T5 may be optionally included to address thecharge sharing. The transistor T5 has a source node coupled to the powersupply, a drain node connected to the node between the transistors T3and T2, and a gate node coupled to receive the condition signal. If thecondition signal is deasserted, the transistor T5 activates and chargesthe node between the transistors T2 and T3, thus reducing (or possiblyeliminating) charge sharing with the node 36 while the transistor T2 isactive and the transistor T3 is inactive.

[0054] The optional additional inverter may be added to the latchcircuit 34, with the output clock O being driven by the additionalinverter instead of one of the cross coupled inverters forming thelatch. The additional inverter may provide additional noise sensitivityreduction in some embodiments. Since the input of the feedback inverterof the latch circuit 34 is not exposed to noise on the output clock Owires, noise on those wires may be less likely to affect the state ofthe node 36.

[0055] The embodiment of the conditional clock buffer circuit 20A shownin FIG. 5 may be suitable for adding testability features (e.g. scantesting features). For example, by adding a PMOS transistor to the node36, with its gate node coupled to receive test signals, the output clockmay be driven low for test purposes. Similarly, by adding an NMOStransistor to the node 36, the output clock may be driven high for testpurposes. The latch circuit 34 may hold the test value after the addedtransistors are deactivated, which may simplify scan control. Additionaltransistors may be added to generate other test wave forms on the outputclock (e.g. FIGS. 13 and 16 below).

[0056] It is noted that the order of the series connection oftransistors T2-T4 shown in FIG. 5 may be varied. The transistors may bearranged in any order in other embodiments (with the gate terminals ofeach transistor still coupled to the same input signals as shown in FIG.5). For example, the transistor T4 may be at the “top” of the seriesconnection (where transistor T2 is in FIG. 5), with its gate node stillcoupled to the node N1; the transistor T2 may be in the “middle” of theseries connection (where the transistor T3 is in FIG. 5), with its gatenode coupled to receive the clock Clk; and the transistor T3 may be atthe “bottom” of the series connection (where the transistor T4 is inFIG. 5), with its gate node coupled to receive the condition signal.Other orders are also possible.

[0057] In the illustrated embodiment, transistors T1 and T5 are p-typemetal-oxide-semiconductor (PMOS) transistors and transistors T2, T3, andT4 are n-type MOS (NMOS) transistors. Other transistors may be used inother embodiments. Generally, a transistor may be any device having atleast a first node, a second node and a control node. The conductionbetween the first node and the second node is controlled via the controlnode. A transistor is active, or on, if it is conducting and isinactive, off, or deactivated if it is not conducting.

[0058] In other embodiments, the condition window can be moved withrespect to the rising edge of the clock Clk by buffering the clock Clkat the input of the conditional discharge circuit 32. The conditionwindow may thus be placed any where within the high phase of the clockClk, as desired. It is noted that the complimentary circuit may also beused (e.g. the transistors T2-T4 may be PMOS and the transistor T1 maybe NMOS) in other embodiments.

[0059] It is noted that, in some embodiments, the inverter 46 may bereplaced by any logic circuitry which inverts the clock Clk. Forexample, any odd number of inverters coupled in series may be used.Additionally, a NAND or NOR gate may be used (e.g., see FIG. 16).

[0060] Scan Interface

[0061] Turning now to FIG. 6, a block diagram of a second embodiment ofthe integrated circuit 10 is shown. Similar to the embodiment of FIG. 1,the embodiment of FIG. 6 may include the clock generation circuit 12receiving the external clock CLK_E and generating the global clockGlobal_CLK for the clock tree 14. The clock tree 14 may generate localclocks for the static circuitry 50 shown in FIG. 6, and may generateclocks for the dynamic circuit 52 shown in FIG. 6 (ACLKs and BCLKs asshown in FIG. 6). More particularly, the clock tree 14 may includevarious conditional clock buffer circuits for generating the localclocks for the static circuitry 50 (e.g. similar to the abovediscussion) and may also include dynamic scan/clock buffers 54 forgenerating the clocks for the dynamic circuitry 52. The static circuitry50 may be coupled to receive various scan interface signals (e.g. a scanclock SCLK on a first pin 56 of the integrated circuit 10, a scan modesignal SMODE on a second pin 58 of the integrated circuit 10, and a scanin signal SCIN_E on a third pin 60 of the integrated circuit 10). Thescan interface may also include a scan out signal SCOUT_E on a fourthpin 62 of the integrated circuit 10. The dynamic circuitry 52 and thedynamic scan/clock buffers 54 are coupled to receive the scan clock andscan mode signals as well. In the illustrated embodiment, the dynamiccircuitry is coupled to the scan out signal SCOUT_E. The staticcircuitry 50 is coupled to the dynamic circuitry 52.

[0062] The integrated circuit 10 may support scan testing of both thestatic circuitry 50 and the dynamic circuitry 52. In general, “scantesting” or “scan” refers to loading test data (also referred to as scandata) into state elements in the circuits being tested, capturing theoutputs of the circuits being tested in response to the scan data(typically by clocking the circuits being tested one or more times usingthe functional clock(s) to those circuits), and scanning the capturedoutput data out of the state elements in the circuits being tested. Thecaptured output data may be used for comparison with expected outputdata to detect if the circuits being tested are operating properly. Asused herein, scan may be referred to as “active” if the scan signals arebeing used to control the integrated circuit 10 (e.g. data is eitherbeing scanned in or out, or the integrated circuit is being prepared toscan in or scan out data). Scan is “inactive” if the scan signals arenot being used to control the integrated circuit 10.

[0063] Typically, one or more scan chains are defined for the stateelements. The scan chains are serial connections corresponding to thestate elements. The scan in input may be coupled to the first element inthe scan chain, and the scan out output may be coupled to the lastelement in the scan chain. The order of elements in the scan chain isthe order that the scan data is provided on the scan in input as thedata is scanned in and the order that scan data is expected on the scanout output.

[0064] In the illustrated embodiment, the scan interface supported bythe integrated circuit 10 includes (in addition to the scan in and scanout signals): the scan clock SCLK and the scan mode signal SMODE. Thescan clock signal is used to control the serial scanning of scan datainto and out of the scan chain. Each period of the scan clock signalcauses the data in the scan chain to be shifted by one position in thechain. The scan mode signal is used to indicate whether or not scan isactive. In some embodiments, the scan mode signal is used to controlwhether or not certain dedicated scan circuits operate. That is, if scanis active, the dedicated scan circuits operate and if scan is inactive,the dedicated circuits do not operate. By preventing the dedicated scancircuits from operating, power may be conserved (since the dedicatedscan circuits are not toggling) and/or the load presented by thededicated scan circuits on related functional circuitry may be reduced(by isolating the dedicated scan circuitry from the functional paths).

[0065] A relatively small number of control signals are used in theillustrated embodiment: one scan clock and one scan mode signal. Theinterface may provide a relatively simple control mechanism for scanoperation, and its impact on the number of pins employed by theintegrated circuit 10 may be relatively small.

[0066] Prior to activating scan, the external clock CLK_E may bestopped, thus resulting in the stopping of the local clocks (Local_CLKs,ACLKs, and BCLKs; although the ACLKs and BCLKs may be generated from thescan interface signals as well, in some embodiments). Alternatively, thescan mode signal may be used, in some embodiments, to gate the local orglobal clocks. Thus, when scanning is to be started, the staticcircuitry 50 and the dynamic circuitry 52 may be idle.

[0067] The scan clock and scan mode signals are provided directly to thestatic circuitry 50 and the dynamic circuitry 52 in the illustratedembodiment. In the static circuitry 50, various static storage devicesmay be clocked by the scan clock for scanning purposes (as well as by alocal clock for functional purposes). The static storage devices arecoupled into a scan chain (along with the dynamic circuitry 52 asdiscussed below) and may have scan data stored therein when scan isactive. In the dynamic circuitry 52, storage devices and/or dynamiccircuits may be coupled into the scan chain and may have scan datastored therein when scan is active (responsive to the scan clock andscan mode signals).

[0068] In the illustrated embodiment, the dynamic scan/clock buffers 54are also coupled to receive the scan clock and scan mode signals. Thedynamic scan/clock buffers 54 may generate several clock signals for useby the dynamic circuitry in each phase, to ensure that scanned in datais properly propagated through the dynamic circuitry to a storage devicefor sampling. At least some dynamic circuits may require an evaluatephase (and an inactive precharge phase) to propagate a value, forexample. The clocks may function as precharge and/or evaluate clocksduring functional operation, and may exhibit the desired behavior whenscan is active. After the data is propagated to the storage device, thestorage device may sample the result value. The result captured by thestorage device may be scanned out of the storage device for comparisonto the expected data. Examples of clocks to be generated for variousconfigurations of dynamic circuitry 52 are shown in FIGS. 11-13 and14-16. In other embodiments, one clock per dynamic phase may begenerated.

[0069] Generally, the static circuitry 50 and the dynamic circuitry 52may communicate. Functional signals may be fed back and forth (e.g. thestatic circuitry 50 may generate an output that is used by the dynamiccircuitry 52 or vice versa). Additionally, scan signals may be fed backand forth (e.g. connections in the scan chain). While the staticcircuitry 50 and the dynamic circuitry 52 are illustrated as blocks inFIG. 6 for convenience of illustration, generally the static circuitryand dynamic circuitry may be intermixed throughout the integratedcircuit 10 as needed to perform the functions defined for the integratedcircuit 10.

[0070] It is noted that, while the static circuitry 50 receives the scanin signal and the dynamic circuitry 52 provides the scan out signal inthe illustrated embodiment, other embodiments may have the dynamiccircuitry 52 receive the scan in signal and/or have the static circuitry50 receive the scan out signal. Additionally, the integrated circuit 10may support multiple parallel scan chains, either by providingadditional scan in and scan out signals or by multiplexing the scanchains onto the scan in and scan out signals.

[0071] As used herein, static circuits (or static logic) are circuitswhich continuously evaluate based on changes in received inputs, suchthat any change in an input is reflected on the output. Dynamic circuitsare precharged to a first state and conditionally discharge to a secondstate based on certain input values. If the input values change afterthe discharge, the changes in the inputs are not propagated to theoutputs. Generally, dynamic circuits receive at least one clock signalcontrolling the precharge and evaluation of the dynamic circuits.Dynamic circuits may be described as belonging to a dynamic phase. Theprecharge and evaluate of the dynamic circuits belonging to a dynamicphase occur approximately concurrently. Dynamic circuits belonging todifferent dynamic phases precharge and evaluate at different times. Inthe illustrated embodiment, there are two dynamic phases (A phase, withthe precharge and evaluate phases determined by the ACLK(s), and Bphase, with the precharge and evaluate phases determined by theBCLK(s)). The ACLK(s) may be approximately 180° out of phase with theBCLK(s) (i.e. the precharge phase of the A phase may occur approximatelyconcurrent with the evaluate phase of the B phase, and vice versa).

[0072] As used herein, a static storage device may be a storage devicehaving a static logic output. Also, dedicated scan circuits are circuitswhich are used only to provide scan functionality.

[0073] Turning now to FIG. 7, a timing diagram is shown illustratingoperation of one embodiment of the scan interface for the integratedcircuit 10. Other embodiments are possible and contemplated. FIG. 7illustrates the local clocks (Local_CLKs, which may include the ACLK andBCLK, although one is approximately 180° out of phase with theLocal_CLKs), the scan clock SCLK, and the scan mode signal SMODE.

[0074] The local clocks toggle for functional operation (e.g. two pulsesare shown in FIG. 7) and then are stopped in preparation for scanning.The scan mode signal is asserted to indicate that scan is active. Thescan clock is then toggled for a number of periods to scan in the testdata. During scanning, the scan mode signal remains asserted. Subsequentto the last scan clock assertion, the scan mode signal is deasserted. Inone embodiment, the scan mode signal may be deasserted prior to orsubsequent to the first rising edge of the local clocks after scanningis complete, as illustrated by the dashed lines in FIG. 7. In oneembodiment, the scan mode signal may be deasserted any time between thefalling edge of the last scan clock and the falling edge of the firstlocal clock. In other embodiments, the scan mode signal may deassertbefore the rising edge of the first local clock, or after the risingedge of the first local clock.

[0075] It is noted that the scan clock and the local clock may havedifferent periods. For example, the scan clock may be toggled at a lowerfrequency than the local clock, so that the timing requirements on thecircuitry involved in scanning, including any dedicated scan circuitsthat may be included, may be less stringent than functional timingrequirements. The dedicated scan circuits may be sized significantlysmaller than the functional circuits, thus lessening the impact of thededicated scan circuits on the silicon area occupied by the integratedcircuit 10.

[0076] Generally, a signal may be defined to be asserted in any logicstate, and to be deasserted in the opposite logic state. For example, asignal may be defined to be asserted when in a high logic state anddeasserted when in a low logic state (e.g. as shown in FIG. 7 for thescan mode signal). Alternatively, a signal may be defined to be assertedwhen in a low logic state and deasserted in a high logic state. In yetanother alternative, a signal may be implemented differentially, withone difference indicating assertion and the opposite differenceindicating deassertion. The example shown in FIG. 7 will be used for theremainder of this disclosure, but other examples may be used in otherembodiments.

[0077] Turning now to FIG. 8, a circuit diagram illustrating oneembodiment of static scan circuitry is shown. Other embodiments arepossible and contemplated. In the embodiment of FIG. 8, two staticstorage devices 70A and 70B included in a scan chain are shown. Thestorage devices 70A-70B are coupled to receive the local clock Local_CLKas a functional clock, and the scan clock SCLK as a scan clock. Thestorage devices 70A-70B include a functional input (In) and a scan input(SCIn). The scan input is used to connect the storage devices 70A-70Binto a scan chain, and the functional input is used for functionaloperation. The storage devices 70A-70B also include an output (Out)which outputs the stored data (either scan data from the scan input orfunctional data from the functional input). The output of the storagedevice 70A is coupled to static logic 72, which generates a functionalinput to the storage device 70B. The output of the storage device 70A isalso coupled to the dedicated scan circuit 74, which is further coupledto the scan input of the storage device 70B. In the illustratedembodiment, the dedicated scan circuit 74 includes a scan latch 76 and alogic circuit controlling the scan latch. In the illustrated embodiment,the logic circuit includes a NOR gate 78 coupled to receive the scanclock and an inversion of the scan mode signal through an inverter 80.In the illustrated embodiment, the scan latch 76 includes a passgate 82controlled by the logic circuit, a latch 84 comprising cross coupledinverters, and an output inverter 86.

[0078] If the scan mode signal is deasserted, the output of the inverter80 is a logical one, which causes the output of the NOR gate 78 to be alogical zero regardless of the state of the scan clock. Thus, thepassgate 82 is closed in response to the scan mode signal beingdeasserted in the illustrated embodiment, isolating the rest of the scanlatch 76 from the output of the storage device 70A. Thus, the scan latchcircuitry 76 does not toggle in response to the output of the storagedevice 70A if the scan mode signal is deasserted, which may reduce thepower consumed in the scan latch 76 when scan is inactive. Additionally,the load presented on the output of the storage device 70A by the scanlatch 76 when scan is inactive may be the diffusion capacitance of thepassgate 82, whereas the load when scan is active also includes currentdrawn by the latch 84 to toggle based on the state of the output of thestorage device 70A.

[0079] On the other hand, if the scan mode signal is asserted (scan isactive), the output of the inverter 80 is a logical zero and thus theoutput of the NOR gate 78 is the inverse of the scan clock. Thus, duringthe high phase of the scan clock, the passgate is closed and during thelow phase of the scan clock, the passgate is open. The storage devices70A-70B may capture a value from the scan input in response to therising edge of the scan clock (and may propagate the value to the outputof the storage device 70A-70B shortly thereafter). The scan latch 76 isclosed during the high phase of the scan clock, and thus may serve toprevent a race condition between the output of the storage device 70Achanging in response to its scan input and the scan input of the storagedevice 70B. In the illustrated embodiment, the storage devices 70A-70Bupdate in response to the rising edge of the scan clock, and the newoutput value of the storage device 70A is propagated to the scan inputof the storage device 70B during the low phase of the scan clock. Thescan latch 76 holds the propagated value during the high phase of thescan clock, providing hold time for the scan input of the storage device70B.

[0080] As mentioned above, the storage devices 70A-70B and the dedicatedscan circuit 74 may form part of a scan chain. The scan input of thestorage device 70A may be coupled to a preceding element in the scanchain (either another storage device or a dynamic circuit such as thecircuit illustrated in FIG. 9) or the scan in input to the integratedcircuit 10, if the storage device 70A is the first element in the scanchain. The output of the storage device 70B may be coupled to asubsequent element in the scan chain or the scan out output of theintegrated circuit 10, if the storage device 70B is the last element inthe scan chain. The storage devices 70A-70B may be viewed as forming amaster storage element of a master-slave structure, and the scan latch76 may be the slave storage element.

[0081] The storage devices 70A-70B may be any type of storage devicewhich supports scan. Generally, the storage devices 70A-70B may beconfigured to capture the data provided on the input (In) in response tothe functional clock (Local_CLK) and to capture the data provided on thescan input (SCIn) in response to the scan clock (SCLK). The captureddata is provided on the output. While the output of the storage devices70A-70B supplies both the dedicated scan circuit 74 and the functionalpath (the static logic 72), other embodiments may include a separatescan out output for the scan chain. A portion of an exemplary storagedevice (in particular, a flop) is shown in FIG. 10.

[0082] It is noted that, while the logic circuit for controlling thescan latch 76 includes a NOR gate 78 and an inverter 80, otherembodiments may include any logic circuit, dependent on the definitionof assertion of the scan mode signal, the scan clock, and the controlinputs provided on the scan latch 76. Furthermore, any Booleanequivalents of the logic circuit may be used. Additionally, the inverter86 in the scan latch 76 is provided so that the output of the scan latch76 has the same binary sense as the input to the scan latch. In otherembodiments, the inverter 86 may be eliminated and the inversionprovided by the scan latch may be accounted for in the scan data that issupplied to the scan in input of the integrated circuit 10.

[0083] In one embodiment, the static storage devices may be flops,although other devices may be used in other embodiments (e.g. latches,registers, etc.). If the flops are edge triggered, an alternativededicated scan circuit may include an inverter delay chain to eliminatethe potential race condition between the output of the flop 70A changingand the flop 70B sampling the SCIn input in response to the scan clockSCLK.

[0084] It is noted that, in some cases, there may be a race conditionbetween the SCLK rising edge (which may cause the SCIn input of thestorage device 70A to appear on the output of the storage device 70A)and the passgate 82 closing in response to the SCLK rising edge. If sucha race condition exists, the SCLK signal supplied to the storage device70A may be delayed (e.g. using an inverter delay chain) with respect tothe SCLK signal supplied to the NOR gate 78. Alternatively, there may beno race condition due to layout of the circuitry, etc.

[0085] In another alterative that may be used with some embodiments ofthe storage device 70A, the logic circuitry 78 and 80 may be used tosupply the scan clock SCLK to the storage device 70A and the scan clockSCLK may be used to control the passgate 82.

[0086] Turning now to FIG. 9, a circuit diagram of one embodiment of adynamic logic circuit 90 including a dedicated scan circuit (the dynamicscan circuit 92) for supporting scanning is shown. Other embodiments arepossible and contemplated. The dynamic logic circuit 90 may be includedin a scan chain with other dynamic logic circuits or static circuits(e.g. circuitry such as shown in FIG. 8). The dynamic logic circuit 90includes a precharge transistor T6 and an evaluate transistor T7 havinggate nodes coupled to receive the ACLK or BCLK that controls the dynamicphase to which the dynamic logic circuit belongs, as well as one or morepull downs 94 coupled in series with the evaluate transistor T7. Thepull downs 94 are coupled to receive the dynamic inputs to the dynamiccircuit 90, and may have any structure to perform the logic desired inthe dynamic logic circuit 90. The node 96 to which the prechargetransistor T6 and the pull downs 94 are coupled is coupled to aninverter 98, the output of which is the functional output of the dynamiclogic circuit 90. The transistor T8 has its gate node coupled to thefunctional output, and has a source node coupled to the power supply anda drain node connected to the node 96. The transistor T8, duringfunctional operation, is configured to actively retain the precharge ofthe node 96 during the evaluate phase if the pull downs 94 (incombination with the evaluate transistor T7) do not discharge the node96. The dynamic scan circuit 92 is coupled to the node 96 as well as thefunctional output. More particularly, the dynamic scan circuit 92includes a series connection of transistor T9 and T10, a scan latch 100,a passgate 102, and a logic circuit including a NOR gate 104 and aninverter 106 in the illustrated embodiment. The scan latch 100 has aninput coupled to the functional output and an output forming the scanoutput (SCOUT) of the dynamic scan circuit 92. The scan latch 100 iscontrolled by the output of the NOR gate 104, which is also connected tothe gate node of the transistor T10. The gate node of the transistor T9is connected to the functional output. In the illustrated embodiment,the drain node of the transistor T9 is connected to the node 96 and thesource node of the transistor T9 is connected to drain node of thetransistor T10, which has a source node coupled to ground. The passgate102 is connected to the node 96 and to the scan input of the dynamicscan circuit 92. The passgate 102 is controlled by the scan clock.

[0087] If the transistor T10 is active, the transistors T8 and T9 andthe inverter 98 operate as a set of cross coupled inverters. Thus, thevalue on the node 96 is actively maintained (if the transistor T10 isactive) in either state (high or low). If the transistor T10 isinactive, the transistor T8 actively maintains a high state (logic 1) onthe node 96 but the transistor T9 is prevented from actively maintaininga low state (logic 0) on the node 96 (e.g. similar to the operation of atypical dynamic logic circuit that does not include the dynamic scancircuit 92).

[0088] In the illustrated embodiment, the transistor T10 is controlledby the output of the NOR gate 104. If scan is inactive (the scan modesignal is deasserted), the output of the inverter 106 is a logical oneand thus the output of the NOR gate 104 is a logical zero regardless ofthe state of the scan clock. Therefore, the transistor T10 is inactiveif scan is inactive. If scan is active (the scan mode signal isasserted), the output of the NOR gate is the inverse of the scan clock.Accordingly, the transistor T10 is active during the low phase of thescan clock and inactive during the high phase. The combination of thetransistors T8, T9, and T10 actively hold the value on the node 96during the low phase of the scan clock. During the high phase of thescan clock, the transistors T10 and T9 do not actively drive the node96. However, during the high phase of the scan clock, the passgate 102is open and thus the scan input (SCIn) to the dynamic scan circuit 92drives the node 96. By deactivating the transistor T10 during the highphase of the scan clock during scanning, the transistor T9 and T10 donot resist the driving of the node 96 by the scan input. In otherembodiments, the transistor T10 may alternatively be driven directly bythe scan mode signal (or the inverse thereof, if the scan mode signal isdefined to be asserted low).

[0089] Providing the transistor T9 and T10 for operation during scanmode ensures that the value on the node 96 is actively driven in eitherstate. If a binary zero is scanned onto the node 96 via the scan input,the value is actively held by the transistor T9 (active because thefunctional output is a binary one) and the transistor T10 (active duringthe low phase of the scan clock). This circuit arrangement may provideflexibility in the speed at which scan testing is performed. Since thescan value is actively held on the node 96, the scan data may not belost due to leakage currents in inactive transistors connected to thenode 96 even if the scan data is left on the node 96 for a relativelylong period of time. Similarly, the arrangement may provide scalabilityto different manufacturing processes (where leakage currents intransistors may be greater, and thus leakage of the node 96 may behigher).

[0090] The scan clock is held low when scanning is not being performed,and the passgate 102 is closed when the scan clock is low. Thus, thenode 96 is isolated from the scan input during functional operation.Alternatively, the passgate 102 may be controlled by a combination ofthe scan clock and scan mode signal such that the scan mode signalensures that the passgate 102 is closed if scan is inactive andcontrolled by the scan clock as described above if scan is active.

[0091] The combination of the inverter 98 with the transistors T8, T9,and T10 may be viewed as a master storage element in a master/slavestructure, and the scan latch 100 may be the slave. The scan latch 100may generally be similar to the scan latch 76 shown in FIG. 8.Alternatively, any storage device may be used.

[0092] Since the passgate in the scan latch 100 is closed if scan isinactive (similar to the above discussion with respect to FIG. 8) andthe transistor T10 is inactive if scan is inactive for the illustratedembodiment, the dynamic scan circuit 92 may generally not operate ifscan is inactive. That is, the circuitry forming the dynamic scancircuit 92 may generally not toggle during functional operation, thusreducing the power consumption of the dynamic scan circuit 92 duringfunctional operation. Additionally, the load presented by the dynamicscan circuit 92 may comprise the diffusion capacitance of the passgatein the scan latch 100 and the gate node capacitance of the transistor T9on the functional output, and the diffusion capacitance of the passgate102 and the transistor T9 on the node 96. The loading may be relativelylight, and thus the impact on the functional speed of the dynamic logiccircuit 90 may be relatively light.

[0093] Generally, the transistor sizes of the dedicated scan circuitryshown in FIGS. 8 and 9 may be any desired size. The transistor sizes inthe dedicated scan circuitry may be made smaller than the transistorsizes typically used in the functional circuits in some embodiments,since scan is often performed at a lower frequency than functionaloperation. In one implementation, the transistors T9 and T10 may besized similar to the transistor T8. Alternatively or additionally, thetransistors in the dedicated scan circuitry may be designed to have ahigh threshold voltage (which may reduce leakage current in thetransistors).

[0094] It is noted that the gate node connections to the transistors T9and T10 may be reversed in other embodiments. That is, the gate node ofthe transistor T9 may be connected to the output of the NOR gate 104 andthe gate node of the transistor T10 may be connected to the functionaloutput of the dynamic logic circuit 90. It is further noted that, whilethe logic circuit controlling the transistor T10 and the scan latch 100comprises a NOR gate 104 and an inverter 106 in the illustratedembodiments, other embodiments may employ any logic circuit, dependenton the definition of assertion of the scan mode signal, the scan clock,and the control inputs provided on the scan latch 100 and the transistorT10. Furthermore, any Boolean equivalents of the logic circuit may beused.

[0095] In the illustrated embodiment, the transistors T6 and T8 may bePMOS transistors and the transistors T7, T9, and T10 may be NMOStransistors, although other types of transistors may be used in otherembodiments.

[0096] As used herein, the term “functional operation” refers to theoperation of a circuit when scan is not active (that is, when thecircuit is performing its designed function rather than operating in thescan test mode).

[0097] Turning next to FIG. 10, a block diagram of an exemplary portionof a flop circuit 110 which may be included in the storage devices 70Aor 70B is shown. Other embodiments are possible and contemplated.

[0098] The transistors T21, T22, T24, and T25 form cross-coupledinverters than can be used as a memory cell. During the low phase of thelocal clock (Local_CLK) during functional operation (scan clock is low),the transistors T20 and T23 precharge the input and output nodes of theinverters to a high voltage. During the high phase of the clock, thetransistor T29 activates. The input signal (In) and its complement (Inwith a bar over it) are coupled to the transistors T26 and T27.Operation for In being a one (and thus In with a bar over it being azero) will be described first. Transistor 26 is active, and transistorT27 is inactive. Therefore, the node N1 begins discharging through T26(active due to the In signal being a one), T28 (which is always active)and T25 (active due to the precharge). The node N2 (which is also theoutput node) begins discharging through T26 and T24 (active due to theprecharge). Since node N2 is being discharged through two transistorswhile N1 is being discharged through three transistors, N2 is dischargedmore rapidly (which also causes T25 to deactivate and T22 to activate)and thus the node N1 finishes at a high voltage and the node N2 finishesat a low voltage. Similar operation occurs if In is a zero, except thatT27 is active instead of T26 and N1 finishes at a low voltage, and thenode N2 finishes at a high voltage.

[0099] The transistors T32 and T33 operate similar to the transistorsT26 and T27, respectively, in response to the scan input and itsinverse, during the high phase of the scan clock, thus storing the scaninput in the cross coupled inverter structure formed by the transistorsT21, T22, T24, and T25. During the low phase of the scan clock, thetransistors T30 and T31 precharge the input and output nodes of thecross coupled inverter structure (since the local clock is held lowduring scan and therefore the transistors T20 and T23 are active).Additionally, during the high phase of the scan clock, the transistorsT30 and T31 serve to isolate the cross coupled inverter structure fromthe transistors T20 and T23 (which remain active due to the local clockremaining low).

[0100] In the illustrated embodiment, the transistors T35 and T36 arecoupled to the scan clock and prevent the transistors T32 and T33 fromhaving an effect on the rest of the flop 110 if the scan clock is low.Thus, during functional operation, the load presented on the drains ofthe T26 and T27 transistors by the scan transistors T32, T33, T34, andT35 may be limited to the diffusion capacitance of the transistors T34and T35. In other embodiments, the transistors T32 and T33 may becoupled to a transistor controlled by the scan clock similar to thetransistors T26, T27, and T29.

[0101] The nodes N2 and N1 represent the value stored in the flop 110.One or both of the nodes N2 and N1 may be buffered to supply the outputof a flop. For example, in one embodiment, the node N2 may be coupled tothe input of a dynamic to static converter circuit, the output of whichmay be the output of the flop. Alternatively, a pair of cross-coupled2-input NAND gates may have their other inputs coupled to the N2 and N1nodes, respectively, and the output of one of the NAND gates may formthe functional output of the flop.

[0102] Scanning of Dynamic Logic Circuits

[0103] Turning now to FIGS. 11-16, two examples of scanning scan datainto a given node of a set of dynamic logic circuits are shown. Theclocks provided to various dynamic logic circuits are shown, forensuring that the scan data propagates through subsequent dynamic logiccircuits and for ensuring that a result of the scan data reaches asampling device prior to the scan out of the result data. Additionally,the clocks may ensure that the scan data is protected from change untilit propagates. The clocking illustrated in these examples may be used incertain embodiments, although other embodiments may employ dynamic logicscanning without the clocking illustrated in the following examples(e.g. the dynamic logic circuits which are scanned may include localcircuitry to control the clocks during scanning, or may feed only staticlogic, etc.).

[0104] The example illustrated in FIGS. 11-13 is an example in whichscan data is scanned into an output node of a dynamic logic circuitwhich belongs to a first dynamic phase, and the sampling point isthrough one or more dynamic logic circuits in the first dynamic phaseand one or more dynamic logic circuits in a second dynamic phase. Forexample, the first dynamic phase may be the A-phase, corresponding to anACLK which is approximately 180° out of phase with the clock input tothe conditional clock buffers in functional operation, and the seconddynamic phase may be the B-phase, corresponding to a BCLK which isapproximately in phase with the clock input to the conditional clockbuffers in functional operation. However, the opposite phases may beused in other examples. The example illustrated in FIGS. 14-16 is anexample in which scan data is scanned into an output node of a dynamiclogic circuit which belongs to a first dynamic logic phase, and thesampling point is through one or more dynamic logic circuits in thefirst dynamic phase. For example, the first dynamic phase may be theB-phase in the example of FIGS. 14-16, but may be the A-phase in otherexamples.

[0105] Turning now to FIG. 11, a circuit diagram illustrating oneembodiment of a set of dynamic circuits 120A-120F coupled to provide alogic function is shown. Particularly, the output of the dynamic logiccircuit 120A is coupled as an input to the dynamic logic circuit 120B;the output of the dynamic logic circuit 120B is coupled as an input tothe dynamic logic circuit 120C; etc. Each dynamic logic circuit120A-120F includes one or more dynamic inputs (on the left side of thecorresponding dynamic logic circuit as illustrated in FIG. 11), at leastone dynamic output (on the right side of the corresponding dynamic logiccircuit as illustrated in FIG. 11), a precharge input (labeled P in FIG.11), and an evaluate input (labeled E in FIG. 11). The dynamic logiccircuits 120A-120C are in the A-phase and the dynamic logic circuits120D-120F are in the B-phase for this example. The dynamic logic circuit120A is coupled to receive an input from a flop 122 clocked by BCLK(i.e. the dynamic logic circuit 120A is the first stage in the logicfunction). The dynamic logic circuit 120F is coupled to provide anoutput to a flop 124 clocked by ACLK.

[0106] Generally, each dynamic logic circuit 120A-120F is configured toprecharge in response to its precharge input and is configured toconditionally evaluate in response to its evaluate input. Particularly,a pulse low on the precharge input (a “precharge pulse”) causes adynamic logic circuit 120A-120F to precharge and a pulse high on theevaluate input (“an evaluate pulse”) causes a dynamic logic circuit120A-120F to conditionally discharge based on the dynamic inputs to thatdynamic logic circuit (although other embodiments may use differentpulses to cause precharge and evaluation). For example, in dynamic logiccircuits similar to the dynamic logic circuit 90 shown in FIG. 9, theprecharge input may be the gate node of the transistor T6 and theevaluate input may be the gate node of the transistor T7. In functionaloperation, the dynamic logic circuits in a given phase precharge andevaluate substantially concurrently. For scan testing, however, some ofthe dynamic logic circuits in a given phase may precharge and evaluatewhile others do not. Thus, there may be several clocks corresponding toa given phase which operate the same way in functional operation butwhich operate different than each other when scan is active.

[0107] In the example of FIG. 11, the output node (N3) of the dynamiclogic circuit 120A receives scan data. That is, the dynamic logiccircuit 120A may be similar to the dynamic logic circuit 90 shown inFIG. 9 (including the dedicated scan circuitry). The other dynamic logiccircuits 120B-120F do not receive scan data (or provide scan data) inthis example and thus may be dynamic logic circuits without thededicated scan circuitry (although the dedicated scan circuitry may beincluded in these dynamic logic circuits as well, if desired).

[0108] After the scan data has been provided on the node N3 (e.g.through the internal node 96 in FIG. 9), the result corresponding to thescan data at the sampling point (the flop 124 in this example, althoughany storage device could be used in other embodiments) is computed. Thatis, the effect of the scan data is propagated through the dynamic logiccircuits 120B-120F to the sampling point. Particularly, for theillustrated embodiment, each dynamic logic gate 120B-120C in the samedynamic phase (the A-phase) receives at least one evaluate pulsesubsequent to the scan data being provided on the node N3. The evaluatepulse computes the result up to the end of the dynamic phase (e.g. thedynamic logic gate 120C in this example). In other words, the effect ofthe scan data is propagated to the output of the dynamic logic gate120C. Subsequent to the evaluate pulse in the A-phase, at least oneB-phase evaluate pulse is provided to the B-phase dynamic logic circuits120D-120F to propagate the effect of the scan data to the output of thedynamic logic circuit 120F. That is, the result corresponding to thescan data is propagated to the output of the dynamic logic circuit 120F(the input of the sampling flop 124). The sampling flop may then beclocked to sample the output, and the output may be scanned out of theflop 124.

[0109] Additionally, in the illustrated embodiment, the precharge andevaluate of the dynamic logic circuit 120A may be controlled to isolatethe output (node N3) from any changes due to the functional operation ofthe dynamic logic circuit 120A while scan is active. That is, theprecharge and evaluation of the dynamic logic circuit 120A may beprevented until the scan data has been propagated to the sampling pointand sampled.

[0110] In the illustrated embodiment, the dynamic logic circuit 120Areceives an ACLKP clock on the precharge input and the ACLK clock on theevaluate input (where the ACLK clock is the clock which controls theflop 124 as well). The remaining A-phase dynamic logic circuits120B-120C receive an ACLKdyn clock on both their precharge and evaluateinputs. Each of the ACLKP, ACLK, and ACLKdyn clocks are generated bydynamic scan/clock buffers 54 in FIG. 6. The dynamic scan/clock buffers54 generate the ACLKP, ACLK, and ACLKdyn clocks based on the functionalclock when scan is not active, and based on the scan clock and/or scanmode signal when scan is active. Additionally, a BCLK clock is providedon the precharge and evaluate inputs of each of the B-phase dynamiclogic circuits 120D-120F. The BCLK clock may be generated by conditionalor unconditional clock buffer circuits based on the functional clock, asillustrated in FIG. 12, or may also be generated using a dynamicscan/clock buffer circuit 54.

[0111] It is noted that, while the dynamic logic circuits 120A-120Fresemble AND gates in FIG. 11, the symbol is intended to represent anarbitrary logic function in FIG. 11. Each dynamic logic circuit120A-120F may implement any logic function, as desired, and differentlogic functions may be implemented in the various dynamic logic circuits120A-120F. It is further noted that the maximum number of dynamic logiccircuits in series which belong to the same dynamic phase may vary fromembodiment to embodiment.

[0112] It is noted that, while scan data is scanned onto the output ofthe first A-phase stage in the logic function in FIG. 11, any stage inthe A-phase of the logic function may be configured to receive the scandata (and receive the ACLKP and ACLK clocks) in other examples.

[0113]FIG. 12 is a timing diagram illustrating one example of the clocksshown in FIG. 11 and their control during functional operation and scan.Other embodiments are possible and contemplated. The functional clockinput to the clock buffers in the clock tree is shown (Clk), as well asthe scan clock and the scan mode signal. The ACLK, ACLKP, ACLKdyn, andBCLK clocks are shown.

[0114] Two periods of the functional clock Clk are shown prior tostopping the functional clock for scanning. As FIG. 12 illustrates, eachof the ACLK, ACLKP, and ACLKdyn clocks are approximately 180° out ofphase with the functional clock (and are approximately in phase witheach other). Additionally, the BCLK clock is approximately in phase withthe functional clock.

[0115] The functional clock is stopped (low in this example), and thusoscillations of the ACLK, ACLKP, ACLKdyn, and BCLK clocks in response tothe functional clock also stop. In particular, the ACLK, ACLKP, andACLKdyn clocks may stop in a high state (if the condition signal isasserted for the last falling edge of the functional clock) or a lowstate (if the condition signal is deasserted for the last falling edgeof the functional clock) and the BCLK clock may stop in the low state.

[0116] To prevent the precharging of the dynamic logic circuit 120A whenthe scan data is scanned into the node N3, the ACLKP clock is held highduring scan. To prevent evaluation of the dynamic logic circuit 120Aduring scan, the ACLK clock is held low. In this example, the assertionof the scan mode signal is used to drive the ACLK clock low. Thus,before data is scanned into the node N3, the evaluation of the dynamiclogic circuit 120A is stopped. For the ACLKdyn clock, at least oneevaluate pulse is generated before the pulse on the ACLK clock thatcauses the result to be captured in the flop 124. There may beadditional evaluate and/or precharge pulses while scanning is active,and in the example shown, the ACLKdyn clock toggles approximately 180°out of phase with the scan clock. In other embodiments, only oneevaluate pulse may be generated on the ACLKdyn clock.

[0117] After scanning completes, the functional clock is pulsed at leastonce (although multiple pulses may be used if desired). The first pulseon the ACLK clock after scanning completes is indicated by the arrow130. This pulse causes the result on the output of the dynamic logiccircuit 120F to be captured in the flop 124. Prior to this pulse, atleast one pulse occurs on the BCLK clock to propagate the effect of thescan data through the B-phase dynamic logic circuits, and prior to thepulse on the BCLK is at least one pulse on the ACLKdyn clock topropagate the effect of the scan data through the A-phase dynamic logiccircuits. The pulse on the BCLK clock is indicated by the arrow 132, andthe pulse on the ACLKdyn clock is indicated by the arrow 134.

[0118] Turning next to FIG. 13, a circuit diagram of one embodiment of aclock buffer circuit 140 is shown. Other embodiments are possible andcontemplated. The embodiment of FIG. 13 is based on the conditionalclock buffer circuit 20A shown in FIG. 5, and the transistors T1, T2,T3, and T4 (and optionally T5, not shown in FIG. 13) operate similar tothe discussion of FIG. 5 in functional operation, in response to thefunctional clock Clk and the condition signal Con. The functional clockis inverted in this embodiment to provide the 180° out of phase output0. Additionally, the latch circuit 34 and the inverter 46 may operatesimilar to the above circuit in functional mode. Furthermore, the latchcircuit 34 may provide stability of the output 0 and the internal node36 during scan by latching the value provided on the node 36 by theother transistors in the circuit. The clock buffer circuit 140 includesadditional transistors T11 and T12 (and optionally T13), a NOR gate 144,and inverters 146 and 148. The transistor T 11 includes a gate nodeconnected to the output of the NOR gate 144, a drain node connected tothe node 36, and a source node connected to the drain node of thetransistor T13. The transistor T13 also has a source node coupled toground and a gate node coupled to receive the inverted clock Clk. TheNOR gate 144 has inputs coupled to receive an input I1 and to the outputof the inverter 148, which has an input coupled to receive an input I2.The transistor T12 includes a source node coupled to the power supply, adrain node connected to the node 36, and a gate node coupled to theoutput of the inverter 146, which has an input coupled to receive theinput I1.

[0119] The clock buffer circuit 140 may be used to form the dynamicscan/clock buffers 54 for the example shown in FIG. 11. That is, copiesof the clock buffer circuit 140 may be instantiated with the theirinputs programmed as shown in the table in FIG. 13 to generate theACLKP, ACLK, and ACLKdyn clocks. Multiple copies of the clock buffercircuit 140 may be programmed the same way to generate multiple signalscorresponding to a given clock (e.g. for loading purposes). The BCLKclock may be generated using a conditional clock buffer circuit 20Asimilar to the embodiment in FIG. 5 (or an unconditional clock buffercircuit) based on the functional clock, since the BCLK clock follows thefunctional clock in this example.

[0120] When the functional clock Clk is stopped in a low state, thetransistor T2 is active and the transistors T1 and (after a delay) T4are inactive. The transistor T3 is active or inactive based on the stateof the condition signal. Assuming the condition signal was asserted forthe last falling edge of the functional clock Clk, the node 36 isdischarged and thus the output O is high when the functional clock isstopped. Alternatively, if the condition signal was not asserted for thelast falling edge of the functional clock Clk, the node 36 is notdischarged and the output O is low when the functional clock is stopped.

[0121] The table in FIG. 13 illustrates the clock output O desired(either ACLK, ACLKP, or ACLKdyn) and the corresponding connections ofthe I1 and I2 inputs for the copy or copies of the clock buffer circuit140 used to generate that clock. Thus, for the ACLK clock, the input I1is coupled to the scan mode signal (SMODE) and the input I2 is coupledto ground. The input I2 being coupled to ground causes the output of theNOR gate 144 to be a logical zero, and thus the transistor T11 isinactive. The input I1 being coupled to the scan mode signal causes thetransistor T12 to activate in response to an assertion of the scan modesignal. Thus, the transistor T12 charges the node 36 (and thus the ACLKclock is forced low) in response to the asserted scan mode signal.

[0122] For the ACLKP clock, the input I1 is grounded and the input I2 iscoupled to the scan mode signal. The grounding of the input I1 causesthe T12 transistor to be inactive. The connection of the 12 signal tothe scan mode signal causes the transistor T11 to be active if scan isactive. Assuming the clock Clk is low (and thus the gate node of thetransistor T13 is high), the transistors T11 and T13 discharge the node36, and thus the ACLKP clock is high during scan. It is noted that thetransistor T11 may be optional if the condition signal is asserted atthe last falling edge of the functional clock, since the node 36 isdischarged in this case. It is further noted that, if the scan modesignal is deasserted prior to the first assertion of the clock Clk, thetransistor T13 may be optional. The transistor T13 prevents contentionbetween the transistor T11 and the transistor T1 if the scan mode signalis still asserted during the first assertion of the clock Clk (whichactivates the transistor T1).

[0123] For the ACLKdyn clock, the input I1 is coupled to the scan clockand the input I2 is coupled to the scan mode signal. With the input I2signal to the scan mode signal and the input I1 coupled to the scanclock, the output of the NOR gate 144 is in the inverse of the scanclock when scan is active. Therefore, during the low phase of the scanclock, the transistor T11 is active and discharges the node 36 (thetransistor T13 is active due to the inverse of the clock Clk being highduring scan). Additionally, coupling the I1 input to the scan clocksignal causes the transistor T12 to be active during the high phase ofthe scan clock, charging the node 36 and causing the ACLKdyn clock to below. Therefore, the ACLKdyn clock may be approximately 180° out of phasewith the scan clock during scanning. The transistor T13 may be used toprevent contention between the transistor T11 and the transistor T1 ifthe scan mode signal remains asserted for the first assertion of theclock Clk, as mentioned above, and may be deleted if the scan modesignal is deasserted prior to the first assertion of the clock Clk.

[0124] It is noted that the T11, T12, and T13 transistors may be sizedsmaller than the transistors T1-T4, in some embodiments. It is furthernoted that, while copies of the clock buffer circuit 140 may be includedin the dynamic scan/clock buffer circuits 54 with different connectionson the I1 and I2 inputs to generate the ACLK, ACLKdyn, and ACLKP clocks,in other embodiments the unused transistors (and corresponding inputlogic circuits, in the case of the transistors T11 and T12) may beremoved (e.g. the transistors T11 and T13 may be removed for the ACLKbuffer; and the transistor T12 may be removed for the ACLKP buffer).Using the same circuit with different connections on the inputs maysimplify the verification of the circuit for use in the integratedcircuit 10, since clock circuits are often given extra verificationeffort to ensure their proper operation.

[0125] It is noted that, while each dynamic logic circuit shown in FIG.11 includes an evaluate input, in some embodiments some of the dynamiclogic circuits may not include an evaluate input (i.e. they may evaluatein response to inputs being asserted). It is still further noted that,while the clock buffer circuit 140 is conditional in this embodiment, inother embodiments the clock buffer may not be conditional, if desired.

[0126] It is noted that, while specific logic circuits 144, 146, and 148are shown in FIG. 13, other embodiments may use other logic circuits,which may be dependent on the definition of asserted for the inputsignals. Additionally, any Boolean equivalents of the illustrated logicmay be used.

[0127] In the illustrated embodiment, the transistors T11 and T13 may beNMOS transistors and the transistor T12 may be a PMOS transistor,although other transistor types may be used in other embodiments.

[0128] It is noted that, in other embodiments, the drain node of thetransistor T11 may be coupled to the node between the transistors T2 andT3 (since the transistor T2 is active during scan), or to the nodebetween the transistors T3 and T4 (if the condition signal is forcedasserted during scan).

[0129] Turning now to FIG. 14, a circuit diagram illustrating a secondembodiment of a set of dynamic circuits 150A-150F coupled to provide alogic function is shown. Particularly, the output of the dynamic logiccircuit 150A is coupled as an input to the dynamic logic circuit 150B;the output of the dynamic logic circuit 150B is coupled as an input tothe dynamic logic circuit 150C; etc. The dynamic logic circuits150A-150F may be generally similar to the dynamic logic circuits120A-120F, except that the node N4 (the output of the dynamic logiccircuit 150D) is the node into which scan data is provided. Thus, thedynamic logic circuit 150D may be similar to the dynamic logic circuit90 shown in FIG. 9 and the other dynamic logic circuits 150A-150C and150E-150F may or may not include dedicated scan circuitry, as desired.The dynamic logic circuit 150A is coupled to receive an input from aflop 152 clocked by BCLK, and the dynamic logic circuit 150F is coupledto provide an output to a flop 154 (or other storage device) clocked byACLK.

[0130] After the scan data has been provided on the node N4, the resultcorresponding to the scan data at the sampling point (the flop 154 inthis example) is computed. That is, the effect of the scan data ispropagated through the dynamic logic circuits 150E-150F to the samplingpoint. Particularly, for the illustrated embodiment, each dynamic logicgate 150E-150F receives at least one evaluate pulse subsequent to thescan data being provided on the node N4, thus propagating the effect ofthe scan data to the input of the flop 154. The sampling flop 154 maythen be clocked to sample the output, and the output may be scanned outof the flop 154. Additionally, in the illustrated embodiment, theprecharge and evaluate of the dynamic logic circuit 150D may becontrolled to isolate the output (node N4) from any changes due to thefunctional operation of the dynamic logic circuit 150D while scan isactive. That is, the precharge and evaluation of the dynamic logiccircuit 150D may be prevented until the scan data has been propagated tothe sampling point and sampled. Several B-phase clocks may be used togenerate the above behavior, and each of the B-phase clocks may begenerated the same during functional operation.

[0131] In the illustrated embodiment, the dynamic logic circuit 150Dreceives a BCLKP clock on the precharge input and a BCLKE clock on theevaluate input. The remaining B-phase dynamic logic circuits 150E-150Freceive the BCLK clock. Each of the BCLKP, BCLKE, and BCLK clocks aregenerated by dynamic scan/clock buffers 54 in FIG. 6. The dynamicscan/clock buffers 54 generate the BCLKP, BCLKE, and BCLK clocks basedon the functional clock when scan is not active, and based on the scanmode signal when scan is active.

[0132] It is noted that, while the dynamic logic circuits 150A-150Fresemble AND gates in FIG. 14, the symbol is intended to represent anarbitrary logic function in FIG. 14. Each dynamic logic circuit150A-150F may implement any logic function, as desired, and differentlogic functions may be implemented in the various dynamic logic circuits150A-150F. It is further noted that the maximum number of dynamic logiccircuits in series which belong to the same dynamic phase may vary fromembodiment to embodiment.

[0133] It is noted that, while scan data is scanned onto the output ofthe first B-phase stage in the logic function in FIG. 14, any stage inthe B-phase of the logic function may be configured to receive the scandata (and receive the BCLKP and BCLKE clocks) in other examples.

[0134]FIG. 15 is a timing diagram illustrating one example of the clocksshown in FIG. 14 and their control during functional operation and scan.Other embodiments are possible and contemplated. The functional clockinput to the clock buffers in the clock tree is shown (Clk), as well asthe scan clock and the scan mode signal. In this case, the scan modesignal falls after the rising edge of the functional clock. The ACLK,BCLKP, BCLKE, and BCLK clocks are shown.

[0135] Two periods of the functional clock Clk are shown prior tostopping the functional clock for scanning. As FIG. 15 illustrates, eachof the ACLK clock is approximately 180° out of phase with the functionalclock. The BCLKP, BCLKE, and BCLK clocks are approximately in phase withthe functional clock (and are approximately in phase with each other).

[0136] The functional clock is stopped (low in this example), and thusoscillations of the ACLK, BCLKP, BCLKE, and BCLK clocks in response tothe functional clock also stop. In particular, the ACLK clock may stopin a high state and each of the BCLK, BCLKP, and BCLKE clocks may stopin the low state (both states corresponding to the low state of thefunctional clock Clk). Alternatively, the ACLK clock may stop in a lowstate if the ACLK clock is conditional and the condition signal is notasserted on the last falling edge of the functional clock Clk. In eithercase, pulsing the functional clock Clk after scanning results in theACLK clock going low, and then high again (which causes the flop 154 tocapture the output of the dynamic logic circuit 150F). The ACLK may begenerated similar to the example of FIGS. 11-13, which may cause theACLK to go low in response to the assertion of the scan mode signal.Alternatively, the ACLK signal may be allowed to remain high (or low,depending on the state of the condition signal at the last falling edgeof the clock Clk) until the rising edge of the clock Clk (which forcesthe ACLK low). This operation is illustrated via the dotted line on theACLK waveform in FIG. 15.

[0137] During scanning, the BCLKE clock is held low and the BCLKP clockis held high to prevent operation of the dynamic logic circuit 150Dduring scan. The BCLKE clock stops low, and thus is in the correct statewhen scanning begins. However, the BCLKP clock is also low. The scanmode signal is used to drive the BCLKP clock high. In this manner thescan data is isolated from the dynamic logic circuit 150D (arrows 160and 162). The BCLK clock is also low during scanning in this example,although the BCLK clock may have any operation during scan as long as atleast one evaluate pulse occurs after scanning is complete and beforethe pulse on the ACLK clock which causes the flop 154 to capture state.As with the example of FIGS. 11-13, the generation of the BCLK clock inresponse to the functional clock Clk provides the desired evaluate pulse(arrow 164), and then the ACLK pulse occurs (arrow 166).

[0138] Turning next to FIG. 16, a circuit diagram of one embodiment of aclock buffer circuit 170 is shown. Other embodiments are possible andcontemplated. The embodiment of FIG. 16 is based on the conditionalclock buffer circuit 20A shown in FIG. 5, and the transistors T1, T2,T3, and T4 (and optionally T5, not shown in FIG. 16) operate similar tothe discussion of FIG. 5 in functional operation, in response to thefunctional clock Clk and the condition signal Con. Additionally, thelatch circuit 34 may operate similar to the above circuit in functionalmode. Furthermore, the latch circuit 34 may provide stability of theoutput O and the internal node 36 during scan by latching the valueprovided on the node 36 by the other transistors in the circuit. Theclock buffer circuit 170 includes a NOR gate 172 in place of theinverter 46. The transistor which discharges the output of the NOR gate172 in response to the rising edge of the functional clock may be sizedsimilar to the above discussion for the inverter 46. The NOR gate 172also includes an input coupled to an 15 signal. The clock buffer circuit170 further includes a NOR gate 174 coupled to receive the functionalclock Clk as an input and an 14 signal as in input. The NOR gate 174 iscoupled to an inverter 176, the output of which is coupled to the gatenodes of the transistors T1 and T2 and as an input to the NOR gate 172Additionally, the clock buffer circuit 140 includes a transistor T14having a drain node connected to the node 36, a source node coupled toground, and a gate node coupled to the I4 signal.

[0139] The clock buffer circuit 170 may be used to form the dynamicscan/clock buffers 54 for the example shown in FIG. 14. That is, copiesof the clock buffer circuit 170 may be instantiated with the theirinputs programmed as shown in the table in FIG. 16 to generate the BCLK,BCLKP, and BCLKE clocks. Multiple copies of the clock buffer circuit 170may be programmed the same way to generate multiple signalscorresponding to a given clock (e.g. for loading purposes).

[0140] The table in FIG. 16 illustrates the clock output O desired(either BCLK, BCLKP, or BCLKE) and the corresponding connections of theI4 and I5 signals for the copy or copies of the clock buffer circuit 170used to generate that clock. Thus, for the BCLK clock, both the I4 andI5 signals are grounded. In this case, the transistor T14 is inactiveand the clock buffer circuit 170 operates in the same fashion as theclock buffer circuit 20A shown in FIG. 5 (that is, the BCLK clockfollows the functional clock Clk).

[0141] For the BCLKE clock, the I4 signal is grounded, thus deactivatingthe transistor T14 and passing the functional clock Clk to the output ofthe inverter 176. The I5 signal is coupled to the scan mode signalSMODE. Thus, if scan is active, the output of the NOR gate 172 is alogical zero and the transistor T4 is inactive. When the functionalclock Clk starts after scanning is complete (with the scan mode signalstill asserted as shown in FIG. 15), the gate node of the transistor T4is already zero and thus there is no window in which both T2 and T4 areactive. The node 36 is not discharged for the first clock pulse of thefunctional clock, and therefore the BCLKE clock remains low.

[0142] For the BCLKP clock, the I5 signal is grounded and the I4 signalis coupled to the scan mode signal. Thus, if scan is active, the T14transistor is active and discharges the node 36. The BCLKP clock istherefore high if scan is active. Additionally, the I4 signal beingactive at the input of the NOR gate 174 prevents the prechargetransistor Ti from activating while scan is active (since the functionalclock Clk is low, and would otherwise activate the transistor T1). TheBCLKP clock therefore remains high until after the first pulse of thefunctional clock Clk.

[0143] It is noted that, while copies of the clock buffer circuit 170may be included in the dynamic scan/clock buffer circuits 54 withdifferent connections on the I4 and I5 inputs to generate the BCLK,BCLKP, and BCLKE clocks, in other embodiments the unused transistorsand/or logic circuits may be removed (e.g. the transistor T14, the NORgate 174, the inverter 176 may be removed and the NOR gate 172 may bereplaced by the inverter 46 for the BCLK buffer; the transistor T14, theNOR gate 174, and the inverter 176 may be removed for the BCLKE buffer;and NOR gate 172 may be replaced by the inverter 46 for the BCLKPbuffer). Using the same circuit with different connections on the inputsmay simplify the verification of the circuit for use in the integratedcircuit 10, since clock circuits are often given extra verificationeffort to ensure their proper operation.

[0144] It is noted that, while each dynamic logic circuit shown in FIG.14 includes an evaluate input, in some embodiments some of the dynamiclogic circuits may not include an evaluate input (i.e. they may evaluatein response to inputs being asserted). It is still further noted that,while the clock buffer circuit 170 is conditional in this embodiment, inother embodiments the clock buffer may not be conditional, if desired.

[0145] It is noted that, while specific logic circuits 174, 176, and 172are shown in FIG. 16, other embodiments may use other logic circuits,which may be dependent on the definition of asserted for the inputsignals. Additionally, any Boolean equivalents of the illustrated logicmay be used.

[0146] It is noted that the precharge phase and the evaluate phase havebeen described above as being phases of the clock signal. However, it iscontemplated that the precharge phase and the evaluate phase may bederived from the phases of the clock signal. The precharge phase may beshorter or longer than the corresponding clock phase, as may theevaluate phase, as desired. Thus, precharge of the dynamic logiccircuits may be responsive to a clock phase, and evaluate may beresponsive to a clock phase.

[0147] In the illustrated embodiment, the transistor T14 may be an NMOStransistor, although other transistor types may be used in otherembodiments.

[0148] Turning next to FIG. 17, a block diagram of a computer accessiblemedium 300 including one or more data structures representative of theintegrated circuit 10 (e.g. the embodiments shown in FIGS. 1 and/or 6)is shown. Generally speaking, a computer accessible medium may includestorage media such as magnetic or optical media, e.g., disk, CD-ROM, orDVD-ROM, volatile or non-volatile memory media such as RAM (e.g. SDRAM,RDRAM, SRAM, etc.), ROM, etc., as well as media accessible viatransmission media or signals such as electrical, electromagnetic, ordigital signals, conveyed via a communication medium such as a networkand/or a wireless link.

[0149] Generally, the data structure(s) of the circuitry carried on thecomputer accessible medium 300 may be read by a program and used,directly or indirectly, to fabricate the hardware comprising thecircuitry. For example, the data structure(s) may include one or morebehavioral-level descriptions or register-transfer level (RTL)descriptions of the hardware functionality in a high level designlanguage (HDL) such as Verilog or VHDL. The description(s) may be readby a synthesis tool which may synthesize the description to produce oneor more netlist(s) comprising lists of gates from a synthesis library.The netlist(s) comprise a set of gates which also represent thefunctionality of the hardware comprising the circuitry. The netlist(s)may then be placed and routed to produce one or more data set(s)describing geometric shapes to be applied to masks. The masks may thenbe used in various semiconductor fabrication steps to produce asemiconductor circuit or circuits corresponding to the circuitry.Alternatively, the data structure(s) on computer accessible medium 300may be the netlist(s) (with or without the synthesis library) or thedata set(s), as desired. In yet another alternative, the data structuresmay comprise the output of a schematic program, or netlist(s) or dataset(s) derived therefrom.

[0150] While computer accessible medium 300 carries a representation ofthe integrated circuit 10, other embodiments may carry a representationof any portion of the dynamic integrated circuit 10 as shown in any ofthe above figures (or any combination of the above figures).

[0151] Numerous variations and modifications will become apparent tothose skilled in the art once the above disclosure is fully appreciated.It is intended that the following claims be interpreted to embrace allsuch variations and modifications.

What is claimed is:
 1. An apparatus comprising: a first dynamic logiccircuit having an output node on which a scan value is provided duringscan; a second dynamic logic circuit having an input coupled to theoutput node of the first dynamic logic circuit, wherein the firstdynamic logic circuit and the second dynamic logic circuit are in afirst dynamic phase during functional operation; and one or more thirddynamic logic circuits, wherein one of the third dynamic logic circuitshas an input coupled to receive a dynamic logic signal which isresponsive to the second dynamic logic circuit, wherein the thirddynamic logic circuits are in a second dynamic phase during functionaloperation, wherein an output of the third dynamic circuits is sampled inresponse to the scan value during scan.
 2. The apparatus as recited inclaim 1 wherein the first dynamic phase includes a first precharge phaseand a first evaluate phase, and wherein the second dynamic phaseincludes a second precharge phase and a second evaluate phase, andwherein the first evaluate phase and the second precharge phase occur atabout a same time, and wherein the first precharge phase and the secondevaluate phase occur at about a same time.
 3. The apparatus as recitedin claim 1 further comprising: a first clock buffer circuit configuredto generate a first clock controlling at least evaluation of the seconddynamic logic circuit; and a second clock buffer circuit configured togenerate a second clock controlling at least evaluation of the one ormore third logic circuits; wherein the first clock buffer circuit iscoupled to receive a scan mode signal indicative of whether or not scanis active and a scan clock, and wherein the first clock buffer circuitis configured to generate at least one evaluate pulse on the first clockprior to sampling the output of the third dynamic logic circuitsresponsive to the scan mode signal and the scan clock, wherein theoutput is responsive to the scan value on the output node of the firstdynamic logic circuit; and wherein the second clock buffer circuit isconfigured to generate at least one evaluate pulse on the second clockprior to sampling the output of the third dynamic logic circuits.
 4. Theapparatus as recited in claim 3 wherein the first clock further controlsa precharge of the second dynamic logic circuit.
 5. The apparatus asrecited in claim 3 wherein the second clock further controls a prechargeof the third dynamic logic circuits.
 6. The apparatus as recited inclaim 3 further comprising a clocked storage device configured to samplethe output of the third dynamic logic circuits, wherein the clockedstorage device is clocked by a third clock.
 7. The apparatus as recitedin claim 6 further comprising a third clock buffer circuit configured togenerate the third clock, wherein the third clock further controlsevaluation of the first dynamic logic circuit, the third clock buffercircuit responsive to the scan clock.
 8. The apparatus as recited inclaim 7 wherein the third clock buffer circuit comprises: a seriesconnection of transistors coupled between a first node and ground, theseries connection of transistors including at least a first transistorand a second transistor, wherein the first transistor has a firstcontrol node coupled to receive a first signal corresponding to afunctional clock and the second transistor has a second control nodecontrolled by an inverse of the first signal, the functional clockoperating during functional operation; and a third transistor coupled tothe first node and having a third control node controlled by an inverseof the scan mode signal.
 9. The apparatus as recited in claim 7 furthercomprising a fourth clock buffer circuit configured to generate a fourthclock controlling a precharge of the first dynamic logic circuit. 10.The apparatus as recited in claim 3 wherein the first clock buffercircuit comprises: a series connection of transistors coupled between afirst node and ground, the series connection of transistors including atleast a first transistor and a second transistor, wherein the firsttransistor has a first control node coupled to receive a first signalcorresponding to a functional clock and the second transistor has asecond control node controlled by an inverse of the first signal, thefunctional clock operating during functional operation; a thirdtransistor coupled to the first node and having a third control nodecontrolled by an inverse of the scan clock; and a fourth transistorcoupled in parallel with at least the second transistor and having afourth control node controlled by a logic circuit responsive to the scanclock and the scan mode signal.
 11. The apparatus as recited in claim 10wherein the logic circuit is configured to cause the fourth transistorto activate responsive to the scan mode signal indicating that scan isactive and further responsive to the scan clock signal.
 12. Theapparatus as recited in claim 10 wherein the logic circuit is configuredto cause the fourth transistor to be deactivated responsive to the scanmode signal indicating that scan is inactive.
 13. A clock buffer circuitcomprising: a series connection of transistors coupled between a firstnode and ground, the series connection of transistors including at leasta first transistor and a second transistor, wherein the first transistorhas a first control node coupled to receive a first signal correspondingto a functional clock and the second transistor has a second controlnode controlled by an inverse of the first signal, the functional clockoperating during functional operation; a third transistor coupled to thefirst node and having a third control node controlled by an inverse of afirst input; and a fourth transistor coupled in parallel with at leastthe second transistor and having a fourth control node controlled by alogic circuit responsive to the first input and a second input.
 14. Theclock buffer circuit as recited in claim 13, wherein the first input iscoupled to ground and the second input is coupled to a scan mode signalindicative of whether or not scan is active.
 15. The clock buffercircuit as recited in claim 13 wherein the first input is coupled to ascan mode signal indicative of whether or not scan is active and thesecond input is coupled to ground.
 16. The clock buffer circuit asrecited in claim 13 wherein the first input is coupled to a scan clockand the second input is coupled to a scan mode signal indicative ofwhether or not scan is active.
 17. The clock buffer circuit as recitedin claim 13 wherein the series connection of transistors furthercomprises a fifth transistor having a fifth control node coupled toreceive a condition signal.
 18. The clock buffer circuit as recited inclaim 17 wherein the fourth transistor is coupled in parallel with theseries connection of transistors.
 19. The clock buffer circuit asrecited in claim 13 further comprising a sixth transistor coupled inseries with the fourth transistor and having a sixth control nodecontrolled by the first signal.
 20. In an apparatus having a firstdynamic logic circuit having an output node on which a scan value isprovided during scan; a second dynamic logic circuit having an inputcoupled to the output node of the first dynamic logic circuit, whereinthe first dynamic logic circuit and the second dynamic logic circuit arein a first dynamic phase during functional operation; one or more thirddynamic logic circuits, wherein one of the third dynamic logic circuitshas an input coupled to receive a dynamic logic signal responsive to thesecond dynamic logic circuit, wherein the third dynamic logic circuitsare in a second dynamic phase during functional operation, a methodcomprising: generating at least one evaluate pulse on a first clockresponsive to a scan mode signal and a scan clock, wherein the scan modesignal is indicative of whether or not scan is active, and wherein thefirst clock controls at least evaluation of the second dynamic logiccircuit; generating at least one evaluate pulse on a second clockcontrolling at least evaluation of the one or more third logic circuits;and sampling the output of the third dynamic logic circuits subsequentto generating the at least one evaluate pulse on the first clock andsubsequent to generating at least one evaluate pulse on the secondclock, wherein the output is responsive to the scan value on the outputnode of the first dynamic logic circuit.
 21. The method as recited inclaim 20 further comprising generating a third clock controllingevaluation of the first dynamic logic circuit responsive to the scanclock.